Overview of Design for Testability, ATPG Flow, Pattern Generation and Translation

Abstract

In today's VLSI SoC designs, Design for Testability (DFT) is a crucial methodology aimed at simplifying the testing of digital circuits during the manufacturing and debugging phases to ensure their functionality and performance. This technique primarily focuses on identifying whether a fabricated device is defective. By implementing DFT, testing costs and time can be significantly reduced, which in turn enhances manufacturing yield and accelerates time-to-market. Debugging Very Large Scale Integration (VLSI) circuits can be a complex and time-intensive task. Therefore, the strategy is to address failures early in the simulation phase, which can substantially decrease the time required for debugging compared to on-silicon debugging.