SMS Memory Built in Self Test Verification

Abstract

In today's VLSI SoC designs, embedded memories dominate die area and often limit manufacturing yield. Design-for-Testability (DFT) is crucial for detecting manufacturing defects early and ensuring robust design validation. Among DFT techniques, Memory Built-In Self-Test (MBIST) plays a pivotal role by embedding test and repair logic within memory subsystems. MBIST facilitates detection of memory faults such as stuck-at, transition, coupling, and retention faults, using March algorithms and fault models.